光電流成像光譜系統

    Nanobase的光(guang)電(dian)流成像系統XperRam Photocurrent Mapping system 利用(yong)了顯(xian)微(wei)成像掃描技術，對樣(yang)品表面做(zuo)一個(ge)快速(su)掃描。產生的光(guang)電(dian)流信號通過探針引到(dao)電(dian)流源表，再顯(xian)示在軟件界面，做(zuo)成成像圖顯(xian)示樣(yang)品表面電(dian)流分布。

      光電流成像光譜系統Photocurrent Mapping System 又(you)稱為掃描(miao)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)顯(xian)微成像系統，用來(lai)檢測(ce)材料(liao)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)強度(du)分布(bu)的(de)設備，主要用來(lai)測(ce)量(liang)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)材料(liao)的(de)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)響(xiang)應信號(hao)和表(biao)征(zheng)材料(liao)的(de)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)特征(zheng)。XperRam Photocurrent Mapping system 光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)成像系統將光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)材料(liao)對于光(guang)(guang)(guang)信號(hao)響(xiang)應的(de)不(bu)均(jun)勻性(xing)以(yi)可視化和量(liang)化的(de)方式顯(xian)示(shi)出來(lai)。該系統可以(yi)研究(jiu)光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)探測(ce)器(qi)的(de)量(liang)子(zi)效(xiao)率，器(qi)件(jian)的(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻分布(bu)特征(zheng)，研究(jiu)太陽能(neng)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)池光(guang)(guang)(guang)生電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)的(de)不(bu)均(jun)勻性(xing)，研究(jiu)器(qi)件(jian)吸收和電(dian)(dian)(dian)(dian)(dian)(dian)(dian)荷生成的(de)微區(qu)特性(xing)，以(yi)及光(guang)(guang)(guang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)材料(liao)界面，半導體結區(qu)的(de)品質分布(bu)等。

整個系統的(de)個構成如下(xia)圖，包含光(guang)(guang)(guang)(guang)(guang)(guang)源(yuan)（激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)器(qi)或者連(lian)續光(guang)(guang)(guang)(guang)(guang)(guang)源(yuan)），顯微鏡(jing)(jing)，激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)掃描(miao)振鏡(jing)(jing)，數字(zi)源(yuan)表(biao)(biao)，探(tan)針臺和(he)計算機軟件等(deng)。激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)通(tong)過掃描(miao)振鏡(jing)(jing)，擴束(shu)鏡(jing)(jing)，經過顯微鏡(jing)(jing)聚焦到樣品(pin)表(biao)(biao)面，激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)激(ji)發產生光(guang)(guang)(guang)(guang)(guang)(guang)電(dian)(dian)(dian)效應（電(dian)(dian)(dian)流(liu)(liu)(liu)），電(dian)(dian)(dian)流(liu)(liu)(liu)信號通(tong)過探(tan)針引出至(zhi)(zhi)電(dian)(dian)(dian)流(liu)(liu)(liu)源(yuan)表(biao)(biao)，再讀(du)出至(zhi)(zhi)電(dian)(dian)(dian)腦軟件，掃描(miao)時，振鏡(jing)(jing)是通(tong)過偏振光(guang)(guang)(guang)(guang)(guang)(guang)控制器(qi)控制，激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)的(de)光(guang)(guang)(guang)(guang)(guang)(guang)斑(ban)再樣品(pin)的(de)XY方向上掃描(miao)移動(dong)，軟件記(ji)錄每(mei)一個激(ji)光(guang)(guang)(guang)(guang)(guang)(guang)聚焦光(guang)(guang)(guang)(guang)(guang)(guang)斑(ban)的(de)位置(zhi)和(he)其對應的(de)電(dian)(dian)(dian)流(liu)(liu)(liu)值，在軟件的(de)一側，同步(bu)描(miao)繪出光(guang)(guang)(guang)(guang)(guang)(guang)電(dian)(dian)(dian)流(liu)(liu)(liu)成像圖，顯示(shi)了樣品(pin)的(de)電(dian)(dian)(dian)流(liu)(liu)(liu)分(fen)布。

功能(neng)描述

l  光電流成像（Photocurrent Measurement and Imaging ）

                          光電流系統探針臺                                                                 三星光電院定制(zhi)的光電流系統

光電流成像圖(tu)和電流計(ji)數值

                      簡易光電流平臺（Side plate）                   Positioner                      Holder                                    探針

產品(pin)特點(dian)

Ø  超快掃描成像（大于1000譜/S）

Ø  超緊湊(cou)結構（光電流掃描成像和顯(xian)微鏡(jing)一體式設計）

Ø  成本低(di)（客(ke)戶僅需要在原(yuan)來的探(tan)針臺(tai)或者拉曼設(she)備上做改造就(jiu)可(ke)以，不需要額外購買平(ping)移臺(tai)，這是振鏡掃(sao)描的優勢所在）

Ø  可視化和(he)(he)人性化軟件（定制研發了電流源表(biao)輸出和(he)(he)成(cheng)(cheng)像掃(sao)描視覺窗口，客戶在(zai)一個界面(mian)實現光電流數據和(he)(he)成(cheng)(cheng)像mapping的(de)對比比較方(fang)便）

Ø  可擴展(zhan)增(zeng)加(jia)其它波長(chang)的(de)激光(guang)(guang)器，增(zeng)加(jia)拉曼光(guang)(guang)譜，熒光(guang)(guang)光(guang)(guang)譜成像系統等

Ø  可增加高(gao)低溫(wen)恒溫(wen)器，鎖相放大器，斬波器等

基本參數(shu)

探針(zhen)臺參(can)數：

應用領域

石墨烯，二維(wei)材料(liao)，半導體工業，結晶度(du)分析(xi)，太陽能(neng)電(dian)池，儲能(neng)材料(liao)，探測器(qi)光(guang)電(dian)性(xing)能(neng)檢測，晶圓體分析(xi)，探測器(qi)檢測，器(qi)件吸收(shou)和電(dian)荷生成的微區特性(xing)。

相關文獻

• 石墨烯通過嵌段共(gong)聚物的納米化實現了等離子體輔(fu)助(zhu)設計(ji)的多共(gong)振光檢(jian)測(ce)

• 
  
  
  
  
  
  
  
  
  Large Work Function Modulation of Monolayer MoS2 by Ambient Gases

• 石墨(mo)烯的光(guang)電流成像檢(jian)測

• 石墨(mo)烯的離子-凝膠介質調制石墨(mo)烯的Dirac點電壓及其應用